product Wizard 2000 Listing Template - AW2KLOT#:15884Wayne Kerr WKL 4220 Auto LCR Bridge Meter Capacitance Resistance RCL 4225We gladly ship worldwide!Wayne Kerr 4220 Digital In-Circuit System LCR MeterAt last you can test with a digital in-circuit tester that offers comprehensive analogue capabilities and fast applications at a price you can afford.FacilitiesDigital In-CircuitAnalog In-CircuitAnalog/digital functionalSeamless Mixed ModeWindows 95/NT20,000 Device LibraryFastest Test SpeedHighest CoverageCalibration & Self TestIntegrated developmentVectorless testFlatbed In Line or Manual HoodVXI,GPIB,SerialUser Expandable to 2048 PinsFull Paper Manual SetOperator KeypadAdvanced In-Circuit Test SystemNew products and technologies demand increasingly more sophisticated, yet cost effective, board test solutions. The 4200 Wayne Kerr Advanced Manufacturing Test System is an in-circuit plus system that meets these needs while it overcomes the traditional issues associated with ASIC, VLSI, FLASH and dense, surface mounted components.It includes, as standard, comprehensive mixed mode capabilities that deliver far greater test coverage than conventional in-circuit test systems, significantly increasing coverage, significantly reducing test times and reducing the time to market through advanced development and prototyping tools. This system ensures efficient use of your capital, space and labour.Overview SpecificationDigital In-Circuit and Analogue/Digital functional capabilityMaximum of 2048 universal pinsWindows 95 or Windows NT operating systemAutomatic program generation softwareGraphical program debug capabilityAutodebug facilityInductive and capacitive vectorless testISP and FLASH programmingIntroductionThe 4200 series is designed to be the fastest manufacturing test system on the market. It is ideally suited to high volume manufacturing operations where error free throughput is of paramount importance. The system tests a wide variety of printed circuit boards covering applications such as telecoms, automotive and consumer electronics, amongst others.By achieving the highest level of fault coverage, and testing product in the shortest possible time, the 4200 series reduces capital investment by providing a single test station within the beat rate of the production line. Quite simply, a single 4200 series tester can perform a task which would normally require several traditional systems.ArchitectureThe 4200 series is controlled by an industry standard PC with a choice of Windows 95or Windows NToperating systems. The graphical user interface provides a familiar environment allowing new users to quickly progress along the learning curve.The 2048 pin 4220 system uses a card cage architecture and can be fitted with a range of cards selected from the following list to provide the most appropriate configuration:Universal In-Circuit card (includes Digital and Analog capability on every pin)Analog In-Circuit cardGeneral Purpose Input/Output cardInstrument Access cardAnalog and Digital TestingThe key to low test times is the optimization of analog tests, including contacts, shorts and opens. The 4200 series offers a combination of high speed and exceptional accuracy through innovative pipeline and parallel processing techniques. A further factor is the utilization of advanced DSP measurements.High guarding ratios and multiwire measurements ensure component isolation and accurate diagnostics during In-Circuit tests.Every pin is backed by analog and digital resources, and their ability to be used in conjunction with each other is a vital element in mixed signal testing, which facilitates seamless testing of devices such as ADC, DAC and CODEC etc.Every pin is provided with terminators to enable the testing of tristate buses and open collector devices. Slew-rate controlled pin drivers ensure that vectors delivered to the testpoint are high integrity and load tolerant.For the testing of free running devices a 50 MHz clock synchronization and phase locking system is provided. Vector rates of 5 MHz with 20 ns edge placement ensure that dynamic devices maintain keep-alive speed. Testing the most complex VLSI devices is achieved using the advanced features such as hardware triggers, pin formatting and variable timing sets.The effectiveness of the 4200 series is further enhanced by the ability to program FLASH devices and utilize the capability of Xilinx TM or Lattice TM ISP chips without additional hardware, further reducing the cost.Test LanguageA high level structured programming environment with fully integrated edit and debug facilities delivers the twin benefits of top level simplicity while also allowing the control of all system parameters.Simple language statements specify 'packaged' tests for common types of measurement, selecting appropriate stimuli settings and measurement ranges automatically. These default settings can be altered. Full interactive edit and debug is achieved through a high speed incremental compilation process which provides instant edit to test switching.The graphical user interface features a menu system providing full control of peripherals. Numeric data can be expressed in decimal, hexadecimal, octal and binary as well as engineering notation (e.g. 10 mV).Test Program GenerationTo ensure rapid time-to-market, test programs are normally generated from CAD data. The industry standard FABmaster converter is used to link a wide range of CAD formats to the Computer Assisted Program Generator. This guarantees quick and accurate creation of fixture and program data. In order to reduce the subsequent debug time, a simulator is used to apply the necessary guards to the test program.All of the test methods supported by the 4200 series are seamlessly integrated into CAPG without having to resort to using external packages.Graphical Debug ToolsA suite of integrated graphical debug tools is supplied, reducing the time-to-market aspects of the test process. In the case of analog measurements, a histogram display is used to dynamically display results with reference to nominal values and tolerances. Digital tests show state and timing information across the whole of the pinface. Flow trace and test structure diagrams are also provided, fully integrated into the test editors.AutodebugThis facility improves time-to-market by using automatic debug algorithms. By altering the range of measurement parameters and analyzing the subsequent results across a number of reiteration modes, the autodebug facility is able to quickly commission the analog In-Circuit tests. The graphical user interface allows user selection of all parameters to ensure the best results in the time available.Boundary ScanThe 4200 series fully supports the IEEE 1149.1 boundary scan standard for overcoming access and testability limitations. Automatic test generation is provided for boundary scan devices appearing singly or within scan paths. These tests are derived from the CAD data describing the board and the Boundary Scan Description Language file relating to each device. The process is automatic and fully integrated facility.Functional Cluster TestingThe 4200 cluster test facility is a useful tool when nodal access is an issue. The cluster test facility is used to define and test the functionality of a number of components as a single logical entity. For instance, the individual components of an amplifier circuit could be tested individually using the In-Circuit capability, followed by a test to ensure that the full amplifier circuit is performing correctly.Vectorless TestingThe 4200 offers both inductive and capacitive vectorless techniques, ensuring wide test coverage across a range of components from complex ASICs to connectors. Inductive probing is performed using the Q-test II technique, whilst capacitive tests use the industry standard HP TestJet TM probe. This allows the most appropriate technique for a given application.These two techniques contribute to the system's ability to generate tests for devices quickly, and to accurately diagnose faults to enhance productivity and quality.Production Line IntegrationThe 4200 series is designed to easily integrate into a high volume production line or to be used manually by an operator. By selecting the horizontal interface, in conjunction with the correct height setting, the 4200 series conforms to both SMEMA and de-facto standards for manufacturing automation.FixturingA range of low cost, high quality fixturing is available covering various sizes and actuations. product Includes the unit shown as seen in the picturesDon't forget to place your buy. By looking on this product you agree to the following terms:Shipping Terms:Buyer pays all shipping costs.Let us know if there is an issue with the shipping costs, as they are automatically calculated by eCRATER.Shipments made to California must include 7.75% sales tax unless we are provided with a valid resale certificate.We reserve the right to ship with Fedex ground, USPS and any other carrier in the best interests of the buyer and seller.The Parcel post option is only available to alaska, Hawaii, and US territories only. If you select parcel post and you live in the lower 48 states you package may be sent by another carrier and/or an additional shipping amount may be required.Payment Terms:Payment is to be made by PayPal in U.S. funds.Please contact us if you have any questions about eCRATER's recent payment policy change.Payment is to be received within ten days of close of product.Should payment not be received within ten days the item will be re-listed and high buyder will forfeit.No personal checks will be accepted.International Terms: (These terms only apply to international shipments.)Buyer is responsible for all brokerage, customs, and or duty charges.Not all items are available for international shipment due to import/export regulations. In the event that we are unable to ship to buyers country, buyer will receive a full refund.Pa